Advanced Thin Film Solutions
 
 
 
                               
 
 Tutorials & Presentations
                               
    On this page, we've listed some presentations on various topics that you may find helpful.  Some of these are papers presented at various industry conferences in recent years.  Others are simple explanations or "how-to" articles.  
 
 
   
                             
  These are Adobe Acrobat slide shows which require Acrobat Reader ver 5.0 or later.  To download the latest version of Acrobat Reader, free from Adobe, click here.  
   
                             
                             
 
    Who we are, what we do, and how to do business with us.  
                             
  An Overview of Thin Film Deposition Measurement & Control Techniques  
    Author:  G Diehl - Sigma Instruments  
      Presented August 2005 at the Rocky Mountain Chapter AVS Symposium.
(The EIES portion of this presentation is the same as the SVC paper below.)
 
                               
    Electron Impact Emission Spectroscopy for Thin Film Deposition Control   
      Authors:  G Diehl, G Halcomb, G Armstrong - Sigma Instruments,
and C Lu - C Lu Laboratories
 
      Presented April 2005 at the SVC Annual TechCon.  
                               
                               
                               
                               
                               
                               
                               
                               
                               
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